SOURCE-LINKED INTELLIGENCE
Inferring Dislocation Microstructures from X-ray Diffraction via Cross-Modal Contrastive Learning
Understanding and inferring dislocation microstructures from diffraction patterns remains an open challenge in materials characterization, as diffraction measurements provide only indirect information about the underlying dislocation structure. In this work, a cross-modal learning framework is developed to enable the prediction of 3D dislocation structures directly from diffraction data. Dislocation density fields generated from discrete dislocation dynamics simulations are paired with corresponding virtual X-ray diffraction patterns and embedded into a shared 2D latent space using contrastive
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Evidence & attribution
- arXiv · AI, language, vision and robotics · 2026-09-11T11:07:49.000Z
First collected: 2026-09-20T18:22:04.777Z. This is not the publication date.