AIIC AI Intelligence Centre

SOURCE-LINKED INTELLIGENCE

Differentiable Jitter Correction using Deep Learning-based Image Quality Metric for Phase-Contrast Micro-CT

arXiv · AI, language, vision and robotics · article · Aug 27, 2026 · UTC

This paper proposes a fully differentiable jitter correction method for X-ray phase-contrast micro computed tomography using a deep learning-based image quality metric that estimates and compensates per-projection rigid jitter directly from the acquired projection data, without a pre-scan motion-free reference. The approach builds on a gradient-based auto-focus strategy adapted to parallel-beam geometry. A set of candidate objective functions is benchmarked in a controlled study, and the sensitivity of the visual information fidelity (VIF) metric to the jitter artifact is verified with the tar

Read original source ↗ Open in workspace

recordType
paper
region
Global

Evidence & attribution

First collected: 2026-09-21T08:51:59.673Z. This is not the publication date.