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Prescreening Point Defects in Semiconductors With Machine Learning

arXiv · AI, language, vision and robotics · article · Sep 13, 2026 · UTC

High-throughput calculations using density-functional theory (DFT) are commonly used to explore point defects for applications in power electronics and quantum technologies. There is currently a major shift away from these traditional simulation techniques towards machine learning (ML) methods. We explore a class of physics-guided ML models for predicting defect formation energies and zero-phonon lines (ZPL) to identify point defects for quantum applications. The models are specifically targeted for use in a prescreening step for accelerated high-throughput workflows, and are therefore designe

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Evidence & attribution

First collected: 2026-09-20T12:21:05.240Z. This is not the publication date.